Keithley Parametric Test Systems
Highly Configurable, Instrument Based System, Intuitive Test Set up. Datagathering and Analysis with ACS Software, Full Control of Automated and Semi-automated Probers.
Applications include Semiconductor Process Control Monitoring (PCM), TEG Test, and Die Sort
Parallel Test capability maximizes test throughput
Measure from kV to fA in a single probe touchdown to further boost productivity
ISO-17025 System-level calibration
Smooth migration from legacy test systems, including probe card re-use
Low Cost-of-Ownership (COO)
